无锡招聘

职位描述：
Nanometrics is a US-based MNC and a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs.

APPLICATIONS SCIENTIST / ENGINEER (POSITION BASED IN Shanghai,China)
Responsibilities:

You will have the opportunity to work closely with process engineers in Semiconductor
Fabs to provide Metrology solutions for complex multi-layer Thin Film measurements,
Optical Critical Dimension (Scatterometry) measurements and Overlay measurements for
sub-100nm features. Duties will include applications development and characterization of
cutting edge measurement technologies, making technology/product presentations and
technical training for customers. You will also be responsible for high level Applications
support of complex measurement systems used to manufacture Semiconductor devices /integrated circuits.

Requirements:
1. PhD in Electrical & Electronics/Mechanical/Chemical/Materials Engineering/Physics (Fresh Graduates are encouraged to apply)
2. Individuals should be able to work independently requiring minimal supervision
3. Strong interpersonal and technical communication skills
4. Excellent analytical and problem-solving skills
5. Fluency in spoken/written English
6. To be located in Shanghai,China

Successful candidates will receive an excellent remuneration package including plus other company benefits/perks, commensurate with experience and qualifications will be rewarded. If you are a talented, smart, self-driven, self-motivated individual who possess the above qualifications and is willing to take up new challenges anytime, please email complete resume and most recent photograph immediately to:

The Advertiser
Email: jjin@nanometrics.com
Only short listed candidates will be notified for interview
http://www.nanometrics.com 举报 分享

Nanometrics provides market leading high-performance process control metrology and inspection systems used in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. We are committed to teamwork and continuous improvement that allows us to outperform our competition with technology leadership and profitable growth.
Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications.
Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. Nanometrics has an extensive installed base of more than 6,500 systems in over 150 production factories worldwide. Our major customers and original equipment manufacturer partners include the largest semiconductor and process equipment manufacturers in the world.
Nanometrics was incorporated in California in 1975 and reincorporated in Delaware in 2006. Nanometrics has been publicly traded since 1984 and is listed on NASDAQ (NANO).

Nanometrics (NANO) - 半导体度量设备生产商
 
 
纳诺半导体-Nanometrics Incorporated(NASDAQ:NANO)创立于1975年，总部位于美国加州米尔皮塔斯，在全球范围内提供高性能的过程控制计量和检测系统，用于集成电路、传感器、分立元件、高亮度发光二极管和数据存储设备的制造。

Nanometrics主要在美国、日本、韩国和国际上提供积体电路、高亮度LED、分离式元件及资料储存装置等制造中使用的高性能工序控制测量和检测系统。

Nanometrics公司提供自动测量系统，用于计量光学关键尺寸(OCD)量测、薄膜测量以及晶圆应力在电晶体及交互运作下的测量应用和Lynx平台，能使集群计量工厂自动化可应用于晶圆计量。如光学关键尺寸的测量和薄膜工序的控制。

此外，公司的自动和整合系统还用于多种工序控制上，包括尺寸和薄膜厚度测量、地型测量装置、缺陷检测和覆盖登记，以及用于薄膜其他各种性质分析上，如其光学，电学及材料等。

Nanometrics工序控制解决方案部署于生产工序上，从前端的基板制造到大批量的半导体和其他装置的生产，以及到晶圆级封装的应用工序皆有之。

Nanometrics公司直接或透过代工厂商管道，销售其测量和检测系统予半导体制造商和设备供应商，以及高亮度的LED、太阳能光伏、资料储存装置、矽晶圆和光罩等制造商。