深圳招聘

Test development and implementation for testing and characterization of NAND memory on ATE (such as: Nextest) test systems.

Provide test engineering support for design debug activity and failure analysis.

Be responsible for all aspects of test debug and validation, correlation, revision control.

Characterization of all memory technology and designs for logic/ functionality, performance, power consumption, timing and some aspects of reliability.

Perform AC/DC and logic/data sheet characterization across process, operating voltage and temperature to do the low yield analysis on issues pertaining to design marginality.

Initiate the test Methodology, Lead the Junior Engineers to take over some challenging Characterization items. (such as Function, DDR2 test etc.,)

Assist on low yield analysis on issues related with Circuit design.

Provide product engineering support for solving production yield issues through improvement from design or packaging technology.

Organize and monitor projects from inception through delivery.

Requirements:

？ Good understanding of NAND basic logic operations, AC timings, DC parametric, and NAND Flash interface protocol.

？ Require familiarity with common lab equipment such as digital scope, logic analyzer, V/I sources.

？ Require good written and verbal English, Present in the meeting with international teams.

？ Require good communication skills with cross functions.

BASIC / KEY Qualifications:

？ Require a BSEE degree or above with 8~12 years related experience at IC test & IC application / validation field

？ Require familiarity with common lab equipment such as digital scope, logic analyzer.

？ Strong skills of testing program development on ATE, solid skills on Language

C++/C#

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