上海招聘

Job Purpose:

1.For Fab8 40/45nm quickly ramp up and mass production;

2.Better support TD advance technology development to reduce learning time;

3.Advanced Inspection tool methodology studies.

Job Responsibility:

1.Take charge of 40/45LG baseline defect reduction and excursion control for ramp up and mass production;

2.Support defect detection and reduction for 32/28 node;

3.Study new methodology for defect detection & defect reduction;

4.Evaluate advanced inspection tools as well as their applications(BF/DF/EBI/WEI)

Job Requirements:

1.More than 10 years of working experience on defect detection and reduction;

2.Experiences with advanced technology (below 45nm node) are highly preferred;

3.More tan 5 years of working experience in advanced inspenction tools (Bright field KLA 2825/35, Dark field Puma9550/9150 & e-Beam);

4.New methodology (like PWQ, wafer edge engineering...) & defect analysis/troubleshooting skill on 40/45nm &32/28nm technology node.

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